By Alan B. Grebene
A pragmatic, engineering publication discussing the main sleek and normal thoughts for designing analog built-in circuits which aren't electronic (excluding laptop circuits). Covers the fundamentals of the units, production know-how, layout approaches, shortcuts, and analytic innovations. comprises examples and illustrations of the simplest present perform. --This textual content refers to an out of print or unavailable version of this identify.
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Extra resources for Bipolar and MOS Analog Integrated Circuit Design
B) The size of the sample on which to test any given parameter (c) What test limits to apply compared with the specification limits (d) How many samples should fail the test specification limit before a device is rejected. (e) The system of measurement. What parameters should be tested? It is a lengthy and costly business to test all the parameters of any semiconductor except for the application where extreme reliability is needed as for devices in submerged repeaters. At the other end of the scale a device might need no testing since it is used well 26 within its capabilities in an uncritical circuit.
34 VRRM Repetitive peak reverse voltage VRWM Crest (peak) working reverse voltage Continuous (direct) reverse voltage VR For thyristors only; Non-repetitive peak off-state voltage VosM VoRM Repetitive peak off-state voltage VowM Crest (peak) working off-state voltage Continuous (direct) off-state voltage Vo The temperatures at which these tests are performed are specified on the data sheet or assumed to be the maximum case temperature and should not be exceeded. l. l. Voltage ratings definitions VRSM and VosM· These non-repetitive values must never be exceeded otherwise permanent damage to the device will almost certainly occur.
The accuracy achieved is not better than 20% and long term life tests are used to ensure reliability. 4. The junction capacitance and series resistance are both shown as a function of · voltage. Low frequency and microwave frequency measurement techniques are used to evaluate the parameters contained in the equivalent circuit. 3. A selection of uaractor packages.
Bipolar and MOS Analog Integrated Circuit Design by Alan B. Grebene